24 November 2018

IRIS echelle white paper available

IRIS is the first echelle spectrometer without compromises: high resolution, large bandwidth, high throughput, accurate gating, compact and robust. To show the benefits and possibilities of the IRIS echelle spectrometer we have published a white paper. Topics covered (amongst others): its unmatched throughput, UV performance, gating using a low cost CMOS camera and stability. Benchmark […]

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Avaatech’s XRF Core Scanner extended with LIBS capability to scan all elements – from Lithium to Uranium

  Avaatech and SPECTRAL Industries are happy to announce the start of a project for the integration of a Laser Induced Breakdown Spectroscopy (LIBS) instrument into the well-known Avaatech XRF Core Scanner. Like XRF (X-Ray Fluorescence), LIBS is a well-established analytical technology for chemical analysis. The LIBS-technique uses a laser to create a high temperature […]

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15 November 2018

SPECTRAL in Dutch newspaper

Dutch newspaper Leidsch Dagblad published a major article on SPECTRAL Industries. The publication was part of a series covering high-tech innovation in the greater Leiden area. SPECTRAL’s CEO Ad Maas explains the technology and talks about our ambitions. The article can be downloaded via this link (only in Dutch unfortunately): Article Leidsch Dagblad

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10 November 2018

Drill core element mapping

Chemical element mapping of drill cores is a new service SPECTRAL Industries is offering now. We can perform up to 50 x 50 mm² area scans with down to 100 x 100 µm² spatial resolution, visualising any element, including light elements e.g. Lithium and Carbon. We are upscaling our capabilities to also allow for larger […]

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8 November 2018

Successful LIBS demonstration down in a mine

  We successfully demonstrated SPECTRAL’s LIBS sensor 150 meters below the surface in an old silver mine. We showed that our LIBS sensor equipment is robust and transportable for operation down in the mine and that it delivers high quality LIBS signals in this harsh environment. Examples: we detected sulphur at 180.7 nm and trace levels […]

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High Throughput
Non Contact
No Sample preparation
Robust
Fast & Accurate